JournalDOAJCrossrefOpenAlex

Metrology

Metadata for this journal is being enriched from connected scholarly data sources.

Journal information

Publisher
MDPI
ISJN
MTRLG
Subjects
Advanced Electrical Measurement Techniques · Advanced Measurement and Metrology Techniques · Advanced Sensor Technologies Research · Applied mathematics. Quantitative methods · cyberphysical systems · Electronic computers. Computer science · machine learning for metrology · Manufacturing Process and Optimization · measurement uncertainty in dynamic processes · metrology for sustainable manufacturing · Optical measurement and interference techniques · Scientific Measurement and Uncertainty Evaluation · Sensor Technology and Measurement Systems · Surface Roughness and Optical Measurements
Country
CH
Languages
EN
ISSN
E-ISSN
2673-8244
ISSN-L
2673-8244
Open access
Yes
OA since
2021
Publication years
2017–2026
Website

APC records

OPENALEX · 2026
1,000 CHF
DOAJ · 2026
1,000 CHF